Semiconductor Testing
Discover how semiconductor chips are measured, validated, and screened to help ensure they perform as designed.
Testing is used at multiple stages — not just at the end of manufacturing — to evaluate electrical behaviour, detect defects, characterise performance, and judge whether devices meet their specifications. A chip is probed on the wafer, screened again after packaging, and (for some products) stress-tested and validated in a system before it ships.
The testing journey
- 1Design for TestabilityTest structures, scan chains, and BIST are built into the design.
- 2Wafer FabricationDevices are built on the wafer in the fab.
- 3Wafer Probe / Wafer SortEach die is probed and tested on the wafer; good dies are mapped.
- 4Die SelectionKnown-good dies are chosen for packaging.
- 5PackagingDies are assembled into protected, connectable packages.
- 6Final TestPackaged devices are tested to specification before they ship.
- 7Reliability / QualificationBurn-in and stress tests — often on samples during qualification, not every unit.
- 8System-Level ValidationDevices are checked in a realistic system context, where appropriate.
This is a simplified, conceptual journey — not a universal sequence. Real test flows vary by device type, manufacturer, product requirements, and business model. Some reliability tests run during qualification on samples rather than on every unit, and system-level testing is used where appropriate.
Where to start
Discovery pathways, not fixed courses — jump in wherever fits.
Beginner
Start here if semiconductor testing is new to you.
Engineering
For students and engineers who want the working detail.
Industry & Research
For professionals, researchers, and ecosystem participants.
Explore testing by topic
Testing Fundamentals
What semiconductor testing is, and why it happens at many stages.
Introduction to semiconductor testing
What testing measures and where it happens.
BeginnerWhy semiconductor testing matters
Coming soonQuality, reliability, cost, and trust.
BeginnerThe semiconductor testing stage
How testing fits in the end-to-end chain.
Beginner
Wafer Testing
Testing devices while they are still on the wafer.
Wafer test & wafer sort
Electrical test of each die; mapping good dies.
EngineeringWafer probing & probe cards
Making contact with tiny pads to run the test.
EngineeringDie selection & known-good die
Coming soonChoosing dies worth packaging.
Engineering
Package & Final Testing
Testing the finished, packaged device.
Final test
Specification test of packaged parts before shipping.
EngineeringPackage-level testing
Coming soonWhat changes once a die is in a package.
EngineeringSystem-level testing
Validating devices in a realistic system context.
Advanced
Test Equipment
The machines and interfaces that run the tests.
Test equipment ecosystem
How ATE, probers, handlers, sockets, and load boards fit together.
EngineeringAutomated Test Equipment (ATE)
The testers that drive and measure the device.
EngineeringInspection & measurement
Finding defects and measuring structures.
EngineeringAll test & inspection equipment
Browse the equipment hub.
Engineering
Test Methods
Different device types need different test approaches.
Test methods & measurements
How test programs apply stimuli and evaluate results.
EngineeringMetrology & measurement
Measuring dimensions, films, and parameters.
EngineeringDigital, analog, mixed-signal & RF test
How test differs by signal type.
AdvancedMemory testing
Coming soonPatterns, repair, and built-in self-test.
AdvancedPower-semiconductor testing
Coming soonHigh-voltage and high-current test.
Advanced
Reliability & Failure Analysis
Proving devices keep working, and learning when they don't.
Advanced Testing
Where testing is heading — and where it gets hard.
Testing Industry & Supply Chain
The companies, facilities, and ecosystem behind test.
Test supply chain
Test houses, OSAT/ATMP, and equipment vendors.
BeginnerTest & packaging companies
OSAT/ATMP and test-equipment companies.
BeginnerTesting in India
India's assembly-and-test ecosystem.
BeginnerCareers & skills in testing
Coming soonRoles and skills in semiconductor test.
Beginner
Connected across Semitree
- Manufacturing →Where the devices under test are built.
- Packaging →Assembly before final test.
- Design →Design-for-testability and test structures.
- Equipment →Probers, ATE, handlers, inspection.
- Materials →Probe cards, sockets, substrates, interconnects.
- Supply chain →The testing stage, end to end.
- Companies →OSAT/ATMP and test-equipment companies.
- Insights →News, explainers, and analysis.