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Step 9 of 17Wafer fabrication (front-end)

Etching

Removing material through the resist openings.

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At a glance

Inputs

  • Patterned (resist-masked) wafer
  • Etchant gases or liquids
  • Plasma power (dry etch)
ProcessEtching

Outputs

  • Wafer with the pattern etched into the target layer

What is it?

Selectively removing material where the resist pattern leaves it exposed, transferring the resist pattern into the underlying device layer.

Why is it needed?

Etching turns the temporary resist stencil into permanent structure in the real materials — trenches, gates, contacts, and vias. Its directionality and selectivity determine feature fidelity.

How does it work?

Wet etching uses chemical baths and is often isotropic (etches in all directions). Dry/plasma etching uses reactive ions and can be highly anisotropic, cutting straight down to make vertical features.

A good etch is selective — it attacks the target far faster than the mask or the layer beneath — and is precisely timed or endpoint-detected to stop at the right depth.

Critical parameters

  • Anisotropy
  • Selectivity
  • Etch rate
  • Critical-dimension control
  • Endpoint detection

Typical defects

  • Undercut
  • Over/under-etch
  • Sidewall roughness
  • Etch residue / polymer

Equipment involved

  • Reactive-ion etch (RIE) tools
  • Deep-RIE / plasma etchers
  • Wet benches

Materials involved

  • Etchant gases (e.g. fluorine/chlorine chemistries)
  • Wet etchants

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Related research

  • Atomic-layer etching (ALE)
  • High-aspect-ratio etch for 3D NAND / DRAM
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